Impact of Annealing on Perpendicular Magnetic Anisotropy and Interfacial Diffusion in Ultrathin [CoFeB/Pd]×n Multilayer Film
Date Issued
2026-05
Author(s) USM
DOI
10.3390/nano16090558
Abstract
The multilayers of Ta/Pd/[CoFeB (0.3 nm)/Pd]& times;5/Pd films were fabricated by ultra-high-vacuum (UHV) magnetron sputtering and subsequently annealed at temperatures (T-A) ranging from 100 degrees C to 400 degrees C. The magnetic measurements were perf
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