Parameter Optimization on a Tessellation Model for Crack Pattern Simulation
Date Issued
2023
Author(s) USM
DOI
10.1109/ACCESS.2023.3330702
Abstract
The capabilities of a parametric model for crack patterns simulation are presented. Planar tessellations are partitions of the plane into convex polygons (called cells) without overlapping. The Voronoi tessellations and Poisson line tessellations are the
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