Mechanism of oxygen reduction via chemical affinity in NiO/SiO2 interfaces irradiated with keV energy hydrogen and helium ions for heterostructure fabrication
Date Issued
2024-02
Author(s) USM
Gonzalez-Fuentes, C.
Mery, M.
DOI
10.1039/d4nh00460d
Abstract
Low-energy light ion beams are an essential resource in lithography for nanopatterning magnetic materials and interfaces due to their ability to modify the structure and properties of metamaterials. Here we create ferromagnetic/non-ferromagnetic heterostr
